인천대 기계공학과

인천대학교 기계공학과

ENG

교수진/연구

교수진

김경태 교수
주전공
나노스케일 열 및 에너지 전달
담당과목
-
전화번호
032-835-8869
E-mail
kyekim@inu.ac.kr
홈페이지
https://sites.google.com/site/nanotransportlab

학력

  • 2010.02.22 고려대학교  공학박사
  • 2006.02.22 고려대학교  공학석사
  • 2003.08.22 홍익대학교  기계공학사

연구실적

[ 논문 ]
  • Radiative heat transfer in the extreme near field, NATURE , 제528권(집) , 제7582호 , PP.387~391 , 2015.12.17
  • Quantification of thermal and contact resistances of scanning thermal probes, APPLIED PHYSICS LETTERS , 제105권(집) , 제20호 , PP.3107~ , 2014.11.17
  • Electrostatic control of thermoelectricity in molecular junctions, Nature Nanotechnology , 제9권(집) , 제11호 , PP.881~885 , 2014.11.01
  • Characterization of nanoscale temperature fields during electromigration of nanowires, Scientific Reports , 제4권(집) , 2014.05.15
  • Heat dissipation and its relation to thermopower in single-molecule junctions, NEW JOURNAL OF PHYSICS , 제16권(집) , 제1호 , 2014.01.01
  • Heat dissipation in atomic-scale junctions, NATURE , 제498권(집) , 제7453호 , PP.209~212 , 2013.06.13
  • A platform to parallelize planar surfaces and control their spatial separation with nanometer resolution, REVIEW OF SCIENTIFIC INSTRUMENTS , 제83권(집) , 제10호 , 2012.10.01
  • Quantitative Thermopower Profiling across a Silicon p-n junction with Nanometer Resolution, NANO LETTERS , 제12권(집) , PP.4472~4476 , 2012.08.13
  • Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry, ACS Nano , 제6권(집) , 제5호 , PP.4248~4257 , 2012.04.24
  • Quantitative temperature profiling through null-point scanning thermal microscopy, INTERNATIONAL JOURNAL OF THERMAL SCIENCES , 제62권(집) , PP.109~113 , 2011.12.15
  • Quantitative measurement with scanning thermal microscope by preventing the distortion due to the heat transfer through the air, ACS Nano , 제5권(집) , PP.8700~8709 , 2011.10.19
  • Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method, REVIEW OF SCIENTIFIC INSTRUMENTS , 2010.11.01
  • Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave, REVIEW OF SCIENTIFIC INSTRUMENTS , 제81권(집) , 2010.05.01
  • Thermopower profiling of a silicon p-n junction, APPLIED PHYSICS LETTERS , PP.1013~1017 , 2007.01.22
  • Novel nanoscale thermal property imaging technique: the 2ω method. II. demonstration and comparison, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , 제24권(집) , PP.2405~2411 , 2006.09.01
  • Novel nanoscale thermal property imaging technique: the 2ω method. I. principle and the 2ω signal measurement, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , 제24권(집) , PP.2398~2404 , 2006.09.01